https://doi.org/10.1140/epje/i2008-10405-5
Regular Article
Tetracene film morphology: Comparative atomic force microscopy, X-ray diffraction and ellipsometry investigations
1
1. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, D-70550, Stuttgart, Germany
2
3. Physikalisches Institut, Universität Stuttgart, Pfaffenwaldring 57, D-70550, Stuttgart, Germany
* e-mail: gompf@pi1.physik.uni-stuttgart.de
Received:
19
June
2008
Revised:
1
October
2008
Accepted:
14
November
2008
Published online:
19
December
2008
X-ray diffraction, atomic force microscopy and spectroscopic ellipsometry were used to study tetracene thin films as a function of deposition rate. A comparative analysis of the thickness and roughness values allows for detailed modelling of the film morphology. An interdigitated growth mode is established for the coexisting thin film and bulk phases. By comparison with the respective quinone-derivative of tetracene, we were additionally able to identify reaction products by their optical response.
PACS: 68.55.-a Thin film structure and morphology – / 68.55.am Polymers and organics – / 78.66.Qn Polymers; organic compounds –
© EDP Sciences, SIF, Springer-Verlag Berlin Heidelberg, 2008
