Eur. Phys. J. E (2004) 14: 185-192
https://doi.org/10.1140/epje/i2004-10014-4

Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared

¹ INFM Unitá di Napoli c/o Dipartimento di Scienze Fisiche, Universitá di Napoli Federico II, via Cintia, Monte S’Angelo,, 80126, Napoli, Italy
² Dipartimento di Scienze Fisiche, Universitá di Napoli Federico II, via Cintia, Monte S’Angelo, 80126, Napoli, Italy
³ CoreCom, via G. Colombo 81, 20133, Milano, Italy
⁴ CNR-IMM, via P. Castellino 111, 80131, Napoli, Italy
⁵ CNR-ICTP, via Campi Flegrei 34, 80078, Pozzuoli (NA), Italy

^* e-mail: tkachenko@na.infn.it
^** e-mail: antigone@na.infn.it
^*** e-mail: vita@na.infn.it
^**** e-mail: damore@corecom.it
^***** e-mail: luca.destefano@imm.cnr.it
^# e-mail: mali@irtemp.na.cnr.it
^## e-mail: rimas77@inwind.it
^### e-mail: abbate@na.infn.it

Abstract

In this work, we propose spectroscopic ellipsometry as a suitable method for measuring optical properties in soft materials, polymers and liquid crystals, specially selected for use in photonics applications. We show the results of our measurements on some multilayered samples, in the range from visible to the near-IR region, of interest for telecom applications. We point out potentialities and limits of the technique and compare the obtained results with another experimental method, the m-lines spectroscopy, and/or with existing data in the literature. The results about the optical parameters for the analysed materials (the nematic liquid crystal 5CB, one commercial and one lab made optical polymer, and an Indium Tin Oxide film) are useful and interesting by themselves. In fact, as a paradigmatic example, we briefly discuss how an incomplete knowledge of this kind of data can lead to a wrong design of a Bragg grating device. However, more than in the provided data, we put the interest of the present analysis in the warnings about spectroscopic ellipsometry utilization and eventually the necessity of getting complementary information.